RESEARCH.FI

Synchrotron x-ray topography of electronic materials

Referentgranskad

Tuomi, Turkka

Journal of Synchrotron Radiation

2002

Synchrotron X-ray topography of undoped VCz GaAs crystals

Referentgranskad

Tuomi, T.; Knuuttila, L.; Riikonen, J.; McNally, P.J.; Chen, Weimin; Kanatharana, J.; Neubert, M.; R...

Journal of Crystal Growth

2002

Synchrotron x-ray topography of cuprite using conventional thin sections

Danilewsky, A.N.; Schropp, B.; Kek, S.; Tuomi, T.; Taskinen, M.; Rantamäki, R.; McNally, P.J.; Curle...

1997

Synchrotron x-ray topography of III-V semiconductors

Referentgranskad

Tuomi, T.

2000

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Referentgranskad

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, Turkka; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.;...

2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Referentgranskad

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...

Materials Research Society Symposia Proceedings

2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...

2002

X-ray Topography of Semiconductors Using Synchrotron Radiation

Rantamäki, R.

Teknillinen korkeakoulu

1999

Sida 1

Publikationer - 4 544sökresultat

Synchrotron x-ray topography of electronic materials

Synchrotron X-ray topography of undoped VCz GaAs crystals

Synchrotron x-ray topography of cuprite using conventional thin sections

Synchrotron x-ray topography of III-V semiconductors

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

X-ray Topography of Semiconductors Using Synchrotron Radiation

Synchrotron x-ray topographic study of a 'perfect' silicon crystal

Synchrotron X-ray topographic studies of strain in silicon wafers with integrated circuits.

Synchrotron x-ray topography of electronic materials

Synchrotron X-ray topography of undoped VCz GaAs crystals

Synchrotron x-ray topography of cuprite using conventional thin sections

Synchrotron x-ray topography of III-V semiconductors

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

X-ray Topography of Semiconductors Using Synchrotron Radiation

Synchrotron x-ray topographic study of a 'perfect' silicon crystal

Synchrotron X-ray topographic studies of strain in silicon wafers with integrated circuits.

- 4544 results

Publikationer - 4 544sökresultat

Synchrotron x-ray topography of electronic materials

Synchrotron X-ray topography of undoped VCz GaAs crystals

Synchrotron x-ray topography of cuprite using conventional thin sections

Synchrotron x-ray topography of III-V semiconductors

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

X-ray Topography of Semiconductors Using Synchrotron Radiation

Synchrotron x-ray topographic study of a 'perfect' silicon crystal

Synchrotron X-ray topographic studies of strain in silicon wafers with integrated circuits.

Synchrotron x-ray topography of electronic materials

Synchrotron X-ray topography of undoped VCz GaAs crystals

Synchrotron x-ray topography of cuprite using conventional thin sections

Synchrotron x-ray topography of III-V semiconductors

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

X-ray Topography of Semiconductors Using Synchrotron Radiation

Synchrotron x-ray topographic study of a 'perfect' silicon crystal

Synchrotron X-ray topographic studies of strain in silicon wafers with integrated circuits.